Silicon image
Thu, 16 Jul 2009 14:26:40 -0600
System Enables SEMATECH To Verify Alignment Of Bonded
Wafers
And
...
by
Silicon image
@ Thu, 16 Jul 2009 14:26:40 -0600
The Olympus IR Inspection System allows observation and image acquisition of the alignment targets and vias by “seeing” through the 775µm thick
silicon